3D TOPOGRAPHY & ANALYSIS

Advanced Polymer Film

Nanotronics nSPEC^® tool can capture 3D topographies at sub-micron resolution using a rapid, non-contact optical method. nSPEC^® automatically reports surface roughness, as well as a range of related metrics.

These images show data generated by nSPEC^® on samples of a translucent advanced polymer film. Here, according to input parameters, nSPEC^® automatically detects and measures “valleys” in the sample surface. Compiled statistics from measurements like these, as well as surface roughness measurements, allow for rapid sample-group comparisons.

nSPEC^® can be set to trigger a 3D topography when 2D analyzers have located a particular feature class, allowing morphology to be studied and classifications to be fine-tuned.